Application of Wavelet Multi-resolution to Multibeam Backscatter for the Seabed Characterization

TitleApplication of Wavelet Multi-resolution to Multibeam Backscatter for the Seabed Characterization
Publication TypeConference Proceedings
Year2002
AuthorsHou, T, Mayer, LA, Rzhanov, Y
Conference NameOceanology International (OI)
Conference DatesMar 5 - Mar 8
Conference LocationLondon, London, UK
KeywordsSeafloor Characterization
Conference Short NameOI